The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2005

Filed:

May. 17, 2004
Applicants:

Kiyomi Yoshinari, Hitachi, JP;

Yoshiaki Kato, Mito, JP;

Tadao Mimura, Hitachinaka, JP;

Masaru Tomioka, Hitachinaka, JP;

Inventors:

Kiyomi Yoshinari, Hitachi, JP;

Yoshiaki Kato, Mito, JP;

Tadao Mimura, Hitachinaka, JP;

Masaru Tomioka, Hitachinaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J049/42 ;
U.S. Cl.
CPC ...
Abstract

An ion-trap mass analyzing apparatus having means for generating ion-capture electric fields asymmetrical with respect to a reference plane containing a central point of a ring electrode and perpendicular to a central axis of the ring electrode in the inside of an ion trap to resonantly amplify ions rapidly to emit the ions from the ion trap in a short time to thereby permit high-sensitive high-accurate mass analysis stably regardless of the structural stability of ions as a subject of analysis.


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