The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2005

Filed:

Mar. 31, 1999
Applicants:

Toshio Asano, Yokohama, JP;

Kaoru Sakai, Yokohama, JP;

Tetsuo Taguchi, Hitachi, JP;

Isao Tanaka, Hitachi, JP;

Inventors:

Toshio Asano, Yokohama, JP;

Kaoru Sakai, Yokohama, JP;

Tetsuo Taguchi, Hitachi, JP;

Isao Tanaka, Hitachi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N021/00 ;
U.S. Cl.
CPC ...
Abstract

Using an image signal acquired by picking up a sample to be inspected by a color video camera, penetrant inspection and magnetic-particle inspection, which are non-destructive inspections, are carried out so that deficiency candidates, including a pseudo deficiency, are automatically detected and displayed on a screen. A real deficiency can be detected from the displayed deficiency candidates. As image data is stored in memory means, information of a deficiency can be repeatedly reproduced on the screen. In the penetrant inspection, the chromaticity at each position on an image is acquired, a deficiency candidate is extracted based on the chrominance, and the deficiency is distinguished from a pseudo deficiency based on the differential value of the chrominance. A polarization filter eliminates regular reflection originating from illumination in the penetrant inspection, and an ultraviolet-rays cutting filter prevents noise in the magnetic-particle inspection. Both inspections can be carried out with a single probe.


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