The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 13, 2005

Filed:

Jan. 06, 2004
Applicants:

Hsiu-chun Lee, Taipei, TW;

Tse-yao Huang, Taipei, TW;

Yi-nan Chen, Taipei, TW;

Inventors:

Hsiu-Chun Lee, Taipei, TW;

Tse-Yao Huang, Taipei, TW;

Yi-Nan Chen, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L021/8238 ;
U.S. Cl.
CPC ...
Abstract

Disclosed is a method for forming a shallow trench. The method of the present invention comprises steps of providing a substrate; forming a plurality of operation layers on the substrate; forming photoresist on the uppermost one of the operation layers to define a position to be etched; etching a portion of the operation layers at said position to form an opening; forming a spacing layer on the sidewall of the opening; and etching a portion of the substrate corresponding to the opening to form a shallow trench. By the etching method of the present invention, a striation phenomenon caused by the common mask etch is avoided.


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