The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6972551 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 06, 2005

Filed:

Sep. 29, 2003
Applicants:

Charles C. Havener, Knoxville, TN (US);

Riad Al-rejoub, Oak Ridge, TN (US);

Inventors:

Charles C. Havener, Knoxville, TN (US);

Riad Al-Rejoub, Oak Ridge, TN (US);

Assignee:

UT-Battelle, LLC, Oak Ridge, TN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N027/00 ;
U.S. Cl.
CPC ...
Abstract

A widely used scanner device that rotates a single helically shaped wire probe in and out of a particle beam at different beamline positions to give a pair of mutually perpendicular beam profiles is modified by the addition of a second wire probe. As a result, a pair of mutually perpendicular beam profiles is obtained at a first beamline position, and a second pair of mutually perpendicular beam profiles is obtained at a second beamline position. The simple modification not only provides more accurate beam profiles, but also provides a measurement of the beam divergence and quality in a single compact device.


Find Patent Forward Citations

Havener, Charles. (2005). Beam profile monitor with accurate horizontal and vertical beam profiles (U.S. Patent No. 6972551). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6972551

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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