The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 06, 2005
Filed:
Mar. 21, 2003
Applicants:
Ching Man Stanley Tsui, Kwai Chung, CN;
Sai Kit Wong, Kwai Chung, CN;
Shing Kai Yip, Kwai Chung, CN;
Inventors:
Ching Man Stanley Tsui, Kwai Chung, CN;
Sai Kit Wong, Kwai Chung, CN;
Shing Kai Yip, Kwai Chung, CN;
Assignee:
ASM Assembly Automation Ltd., Hong Kong, HK;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J005/00 ;
U.S. Cl.
CPC ...
Abstract
The invention provides a temperature monitoring system for a semiconductor test handler. A preparation stage brings a test device to a predetermined temperature for testing at a test platform at said predetermined temperature. At least one radiation sensor, such as a thermopile device, is employed in the test handler for detecting a surface temperature of the test device by measuring radiation emitted from the test device.