The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 2005
Filed:
Jun. 12, 2002
Applicant:
James P. Williams, Princeton Junction, NJ (US);
Inventor:
James P. Williams, Princeton Junction, NJ (US);
Assignee:
Siemens Corporate Research, Inc., Princeton, NJ (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K009/00 ;
U.S. Cl.
CPC ...
Abstract
Disclosed is a method of analyzing curvilinear structures by receiving three-dimensional space imaging data of a curvilinear structure, defining an axis curve within the curvilinear structure, sweeping a line segment along said axis curve so as to define a ribbon in said three-dimensional space, and adsorbing data from said three-dimensional space onto said ribbon. This ribbon may then be flattened for convenient examination.