The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 29, 2005

Filed:

Nov. 10, 2000
Applicants:

Cecilia Gabriela Galarza, San Francisco, CA (US);

Michail Tsatsanis, Santa Clara, CA (US);

Mark Alan Erickson, San Bruno, CA (US);

Ioannis Kanellakopoulos, Cupertino, CA (US);

James W. Waite, Los Gatos, CA (US);

Ming Gu, San Jose, CA (US);

Sunil C. Shah, Los Altos, CA (US);

Daniel Joseph Hernandez, San Jose, CA (US);

Thomas E. Paré, Jr., Mountain View, CA (US);

Norman Man Leung Yuen, Cupertino, CA (US);

Inventors:

Cecilia Gabriela Galarza, San Francisco, CA (US);

Michail Tsatsanis, Santa Clara, CA (US);

Mark Alan Erickson, San Bruno, CA (US);

Ioannis Kanellakopoulos, Cupertino, CA (US);

James W. Waite, Los Gatos, CA (US);

Ming Gu, San Jose, CA (US);

Sunil C. Shah, Los Altos, CA (US);

Daniel Joseph Hernandez, San Jose, CA (US);

Thomas E. Paré, Jr., Mountain View, CA (US);

Norman Man Leung Yuen, Cupertino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J001/12 ;
U.S. Cl.
CPC ...
Abstract

A method and apparatus for identification of interference sources are disclosed.


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