The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2005
Filed:
Mar. 28, 2002
Klaus-christoph Harms, Graz, AT;
Christian Beidl, Eggersdorf, AT;
Klaus-Christoph Harms, Graz, AT;
Christian Beidl, Eggersdorf, AT;
AVL List GmbH, Graz, AT;
Abstract
In a method for the analysis and evaluation of measured values of an open test system, a test piece is monitored during a test run by at least one signal channel which sends a signal to an evaluation unit for further processing whereby at least one plausibility node is coupled with at least one signal channel. In order to allow a statement to be made about the value of plausibility nodes and their results in relation to a specific measuring task, an evaluated plausibility is ascertained for at least one of the measured values from the type and number of plausibility nodes as well as their possible, variable interconnection. In order to permit, in addition, statements on the reliability of the results of the test system in relation to the desired measured values, it is provided that from the type and number of available plausibility nodes in combination with the type and number of available signal channels, a value is ascertained for the confidence level of the plausibility of at least one of the measured values of the current test system.