The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2005
Filed:
Jul. 24, 2003
Applicants:
Masami Amemiya, Tokyo, JP;
Masato Ozeki, Tokyo, JP;
Inventors:
Masami Amemiya, Tokyo, JP;
Masato Ozeki, Tokyo, JP;
Assignees:
JEOL Ltd., Tokyo, JP;
JEOL Engineering Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K003/00 ;
U.S. Cl.
CPC ...
Abstract
There is disclosed an X-ray analyzer capable of precisely measuring a trace amount of cadmium contained in plastic. The analyzer has an X-ray filter assembly between an X-ray tube having an Rh target and a plastic sample. The filter assembly consists of first, second, and third X-ray filters which are made of zirconium, copper, and molybdenum, respectively. The first through third X-ray filters have thicknesses of about 100 μm, 200 μm, and 40 μm, respectively.