The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2005
Filed:
Dec. 06, 2002
Richard J. Lebel, Willistun, VT (US);
Fredrik Maurer, Valhalla, NY (US);
Paul H. Smith, Jr., Essex Junction, VT (US);
Theodore G. Van Kessel, Millbrook, NY (US);
Hematha K. Wickramasinghe, Chappaqua, NY (US);
Richard J. Lebel, Willistun, VT (US);
Fredrik Maurer, Valhalla, NY (US);
Paul H. Smith, Jr., Essex Junction, VT (US);
Theodore G. Van Kessel, Millbrook, NY (US);
Hematha K. Wickramasinghe, Chappaqua, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An optical probe (and method) for measuring a surface in an environment containing a first substance, includes a light source for transmitting a light onto an area of the surface to obtain a measurement, a source of the first substance including one of a fluid and a gas for displacing a second substance from an area of the surface receiving the light, and a measuring device for receiving the light being reflected from the surface and for determining a measurement of the surface based upon the reflected light.