The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 22, 2005

Filed:

Jan. 22, 2004
Applicants:

Ching Man Stanley Tsui, Kwai Chung, HK;

Chak Tong Albert Sze, Kwai Chung, HK;

Pei Wei Tsai, Kwai Chung, HK;

Lap Kei Eric Chow, Kwai Chung, HK;

Inventors:

Ching Man Stanley Tsui, Kwai Chung, HK;

Chak Tong Albert Sze, Kwai Chung, HK;

Pei Wei Tsai, Kwai Chung, HK;

Lap Kei Eric Chow, Kwai Chung, HK;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R031/26 ;
U.S. Cl.
CPC ...
Abstract

The invention provides a mechanism for a test handler using for electrical testing of electronic devices. The devices are placed on a platform configured to move semiconductor devices from an onloading position to an offloading position along a predetermined path. A transfer arm with a plurality of transfer heads connected to it is located adjacent the path. The transfer heads are configured to pick up and transfer semiconductor devices from the platform to a testing position for testing, and thereafter to transfer the semiconductor devices from the testing position to the platform for offloading.


Find Patent Forward Citations

Loading…