The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2005

Filed:

Dec. 11, 2001
Applicants:

Gilles Ritter, Ollon, CH;

Martin Thomas Miller, Avusy, CH;

Thierry Campiche, Geneva, CH;

Inventors:

Gilles Ritter, Ollon, CH;

Martin Thomas Miller, Avusy, CH;

Thierry Campiche, Geneva, CH;

Assignee:

LeCroy Corporation, Chestnut Ridge, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G005/00 ;
U.S. Cl.
CPC ...
Abstract

An oscilloscope apparatus for scaling and displaying persistence data using interpolation. The oscilloscope apparatus acquires a waveform and accumulates persistence data of the acquired waveform in a results buffer. The size of the persistence data is selectable by the user. A processor scales the persistence data using an interpolation algorithm to the size of a buffer in the display. The user may select a region of interest within the persistence data for scaling and display. In this manner, the persistence data can be zoomed in/out and centered on the display. The interpolation algorithm may be automatically selected or set by the user from standard, bi-linear, bi-cubic, or super-sampling algorithms.


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