The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Sep. 18, 2001
Givargis A. Danialy, San Jose, CA (US);
Stephen V. Pateras, San Jose, CA (US);
Michael C. Howells, San Jose, CA (US);
Martin J. Bell, Santa Clara, CA (US);
Charles MC Donald, San Jose, CA (US);
Stephen K. Sunter, Nepean, CA;
Givargis A. Danialy, San Jose, CA (US);
Stephen V. Pateras, San Jose, CA (US);
Michael C. Howells, San Jose, CA (US);
Martin J. Bell, Santa Clara, CA (US);
Charles Mc Donald, San Jose, CA (US);
Stephen K. Sunter, Nepean, CA;
LogicVision, Inc., San Jose, CA (US);
Abstract
A software and hardware system and an associated methodology provides ATE-independent go/no-go testing as well as advanced failure diagnosis of integrated circuits for silicon debug, process characterization, production (volume) testing, and system diagnosis comprises an embedded test architecture designed within an integrated circuit; means for seamlessly transferring information between the integrated circuit and its external environment; and an external environment that effectuates the seamless transfer for the user to perform relevant test and diagnosis.