The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 25, 2005
Filed:
Jul. 13, 2000
Kenji Shimazaki, Hyogo, JP;
Hiroyuki Tsujikawa, Shiga, JP;
Seijirou Kojima, Kyoto, JP;
Shouzou Hirano, Osaka, JP;
Kenji Shimazaki, Hyogo, JP;
Hiroyuki Tsujikawa, Shiga, JP;
Seijirou Kojima, Kyoto, JP;
Shouzou Hirano, Osaka, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
In contrast with a known dynamic gate-level simulation method, a method of analyzing electromagnetic interference (an EMI analysis method) according to the present invention enables estimation of EMI noise, by means of calculating signal propagation of each node through use of the signal propagation probability technique, and calculating variation time of each node through use of 'the Static timing analysis technique'. In short, the present invention is characterized in calculating a frequency characteristic from the relationship between toggle probability of each node and delay in each node.