The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6958476 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 25, 2005

Filed:

Oct. 10, 2003
Applicants:

Todd J. Davis, Gilbert, AZ (US);

Theodore Allen Paxton, Chandler, AZ (US);

Inventors:

Todd J. Davis, Gilbert, AZ (US);

Theodore Allen Paxton, Chandler, AZ (US);

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J037/304 ;
U.S. Cl.
CPC ...
Abstract

Methods for creating a cross section of at least one feature located on a substrate are disclosed. The methods include coating the feature with a layer of contrast enhancing material, recoating the feature with a second material that is different from the contrast enhancing material, and milling the feature. The second material has substantially similar milling characteristics as the feature. The methods may further include creating an image of the feature and saving the image of the feature.


Find Patent Forward Citations

Davis, Todd. (2005). Methods to improve resolution of cross sectioned features created using an ion beam (U.S. Patent No. 6958476). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6958476

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…