The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6958112 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 25, 2005

Filed:

May. 27, 2003
Applicants:

M. Ziaul Karim, San Jose, CA (US);

Farhad K. Moghadam, Saratoga, CA (US);

Siamak Salimian, Sunnyvale, CA (US);

Inventors:

M. Ziaul Karim, San Jose, CA (US);

Farhad K. Moghadam, Saratoga, CA (US);

Siamak Salimian, Sunnyvale, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C014/34 ;
U.S. Cl.
CPC ...
Abstract

Methods and systems are provided for depositing silicon oxide in a gap on a substrate. The silicon oxide is formed by flowing a process gas into a process chamber and forming a plasma having an overall ion density of at least 10ions/cm. The process gas includes H, a silicon source, and an oxidizing gas reactant, and deposition into the gap is achieved using a process that has simultaneous deposition and sputtering components. The probability of forming a void is reduced by ensuring that the plasma has a greater density of ions having a single oxygen atom than a density of ions having more than one oxygen atom.


Find Patent Forward Citations

Karim, M.. (2005). Methods and systems for high-aspect-ratio gapfill using atomic-oxygen generation (U.S. Patent No. 6958112). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6958112

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