The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2005

Filed:

Aug. 19, 2003
Applicants:

Kinya Kobayashi, Tokyo, JP;

Kiyomi Yoshinari, Tokyo, JP;

Atsushi Otake, Tokyo, JP;

Inventors:

Kinya Kobayashi, Tokyo, JP;

Kiyomi Yoshinari, Tokyo, JP;

Atsushi Otake, Tokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F019/00 ; G01N031/00 ;
U.S. Cl.
CPC ...
Abstract

An apparatus for analyzing mass spectrometric data is described. The apparatus has a first input section for entering first data of an ion measured by mass spectrometry, a second input section for entering second data of a dissociated ion of the ion measured by mass spectrometry, a first data storing section for storing third data of mass spectrometry of a plurality of candidates for the structure of ion, a calculation section for producing fourth data of mass spectrometry of dissociated ions to be used in analyzing the plurality of candidates and an evaluation section for evaluating the plurality of candidates by making comparisons between the first and third data and between the second and fourth data, so that the structure of ion can be identified.


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