The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6954916 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 11, 2005

Filed:

Jun. 30, 2003
Applicants:

Kerry Bernstein, Underhill, VT (US);

Philip G. Emma, Danbury, CT (US);

Leendert M. Huisman, South Burlington, VT (US);

Paul D. Kartschoke, Williston, VT (US);

Norman J. Rohrer, Underhill, VT (US);

Inventors:

Kerry Bernstein, Underhill, VT (US);

Philip G. Emma, Danbury, CT (US);

Leendert M. Huisman, South Burlington, VT (US);

Paul D. Kartschoke, Williston, VT (US);

Norman J. Rohrer, Underhill, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F017/50 ;
U.S. Cl.
CPC ...
Abstract

A method and system for simulating an integrated circuit. The method includes the steps of performing a timing analysis of the circuits to ensure that they meet specified timing criteria, performing soft error analysis of the circuits to determine whether they meet specified soft error criteria, and improving those circuits that fail the soft error analysis to improve their resistance to soft errors and having no degradation on timing. Preferably, the improving step includes the step of improving those circuits that fail the soft error analysis by either having an additional voltage source or altering the capacitance of the circuits.


Find Patent Forward Citations

Bernstein, Kerry. (2005). Methodology for fixing qcrit at design timing impact (U.S. Patent No. 6954916). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6954916

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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