The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 11, 2005
Filed:
Jul. 09, 2003
Stephen R. Quake, San Marino, CA (US);
Guillaume Lessard, Pasadena, CA (US);
Lawrence A. Wade, La Canada, CA (US);
Jordan M. Gerton, Upland, CA (US);
Stephen R. Quake, San Marino, CA (US);
Guillaume Lessard, Pasadena, CA (US);
Lawrence A. Wade, La Canada, CA (US);
Jordan M. Gerton, Upland, CA (US);
California Institute of Technology, Pasadena, CA (US);
Abstract
Methods and systems for operating an apertureless microscope for observing one or more features to a molecular sensitivity on objects are described. More particularly, the method includes moving a tip of a probe coupled to a cantilever in a vicinity of a feature of a sample, which emits one or more photons at a detected rate relative to a background rate of the sample based upon the presence of the tip of the probe in the vicinity of the feature. The method modifies the detected rate of the feature of the sample, whereupon the modifying of the detected rate causes the feature of the sample to enhance relative to background rate of the feature.