The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 04, 2005

Filed:

Oct. 10, 2001
Applicants:

Tomoya Yoneda, Tokyo, JP;

Shunsuke Inoue, Kanagawa, JP;

Tetsunobu Kochi, Kanagawa, JP;

Hidekazu Takahashi, Kanagawa, JP;

Masanori Ogura, Kanagawa, JP;

Inventors:

Tomoya Yoneda, Tokyo, JP;

Shunsuke Inoue, Kanagawa, JP;

Tetsunobu Kochi, Kanagawa, JP;

Hidekazu Takahashi, Kanagawa, JP;

Masanori Ogura, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N003/14 ;
U.S. Cl.
CPC ...
Abstract

An image pickup apparatus is provided, which comprises a plurality of image pickup areas formed on a same semiconductor chip and arranged in the horizontal and the vertical directions, each image pickup area having a plurality of pixels arranged in the horizontal and the vertical directions, a plurality of vertical scanning circuits which sequentially scan pixels in the vertical direction to scan a plurality of image pickup areas in the vertical direction independently from each other, a plurality of lenses, at least one of which is provided in each of the plurality of image pickup areas and which focuses light to form an image on the image pickup areas, and a driving circuit which drives the plurality of vertical scanning circuits so that at least a part of a scanning period of each of the plurality of vertical scanning circuits overlaps with each other.


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