The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 13, 2005

Filed:

Sep. 17, 2003
Applicants:

Yu-ren Wang, Tainan, TW;

Chin-cheng Chien, Chiai, TW;

Hsiang-ying Wang, Chiai, TW;

Neng-hui Yang, Hsinchu, TW;

Inventors:

Yu-Ren Wang, Tainan, TW;

Chin-Cheng Chien, Chiai, TW;

Hsiang-Ying Wang, Chiai, TW;

Neng-Hui Yang, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L021/336 ;
U.S. Cl.
CPC ...
Abstract

A method of manufacturing a MOS transistor is provided. A substrate having a gate structure thereon is provided. A first spacer is formed on the sidewall of the gate structure. A pre-amorphization implantation is carried out to amorphize a portion of the substrate. A doped source/drain extension region is formed in the substrate on each side of the first spacer. A second spacer is formed on the sidewall of the first spacer. A doped source/drain region is formed in the substrate on each side of the second spacer and then a pre-annealing operation is performed. Thereafter, a solid phase epitaxial process is carried out to re-crystallize the amorphized portion of the substrate and activate the doped source/drain extension region and the doped source/drain region to form a source/drain terminal. Finally, a post-annealing operation is performed.


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