The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2005

Filed:

Feb. 15, 2002
Applicant:

Eric R. Wehage, Tenino, WA (US);

Inventor:

Eric R. Wehage, Tenino, WA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C029/00 ;
U.S. Cl.
CPC ...
Abstract

A system and method for creating a built-in self-testing (BIST) state machine to test random access memories (RAMs) are disclosed. The BIST state machine can be simplified to a simple four-state state machine while accommodating a large group of test suites by programming each state to have the capability of performing one of four necessary operations. These operations include a write operation, a read operation, a read/write operation and a null operation. Further bits and signals can be added to the state machine to enable an even larger array of test suites to be performed.


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