The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2005

Filed:

May. 16, 2002
Applicant:

Jesse E. Chen, Sunnyvale, CA (US);

Inventor:

Jesse E. Chen, Sunnyvale, CA (US);

Assignee:

RF Micro Devices, Inc., Greensboro, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B001/06 ; H04B007/00 ;
U.S. Cl.
CPC ...
Abstract

A method for measuring a difference in DC offsets associated with different gain settings in a direct conversion receiver having a variable gain is provided. In a first phase, a set of response parameters that characterize a time-dependent system response to a known change in the DC offset is determined. Each response parameter corresponds to the response measured at a different time after the change. In a second phase, different gain settings are applied to the system and the response is measured at times corresponding to the times associated with each of the response parameters. The response parameters are then used to determine the difference in DC offsets associated with the different gain settings.


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