The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2005
Filed:
Nov. 29, 2002
Applicants:
Rainer Bruchhaus, Kanagawa, JP;
Uwe Wellhausen, Kanagawa, JP;
Nicolas Nagel, Kanagawa, JP;
Stefan Gernhardt, Kanagawa, JP;
Inventors:
Rainer Bruchhaus, Kanagawa, JP;
Uwe Wellhausen, Kanagawa, JP;
Nicolas Nagel, Kanagawa, JP;
Stefan Gernhardt, Kanagawa, JP;
Assignee:
Infineon Technologies Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L029/76 ; H01L029/94 ; H01L031/062 ; H01L031/113 ; H01L031/119 ;
U.S. Cl.
CPC ...
Abstract
Reduced radiation damage to an IC feature is disclosed. At least a portion of the feature which is sensitive to radiation is covered by a radiation protection layer. The radiation protection layer protects the feature from being damaged to radiation during, for example, processing of the IC. In one embodiment, the radiation protection layer comprises a noble metal, oxides, alloys, or compounds thereof.