The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2005
Filed:
Sep. 04, 2002
Applicant:
Sandip Kundu, Austin, TX (US);
Inventor:
Sandip Kundu, Austin, TX (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F017/50 ;
U.S. Cl.
CPC ...
Abstract
A double-edge-triggered flip-flop scan cell. The double-edge-triggered flip-flop scan cell provides the capability to capture and output data for each edge of a clock signal in a functional mode of a host integrated circuit. In a test mode, the double-edge triggered flip-flop scan cell enables test data to be scanned into and out of the scan cell to provide observability and controllability of the scan cell internal state.