The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2005
Filed:
Mar. 25, 2002
Keiji Sato, Kawasaki, JP;
Toshiro Nakazuru, Kawasaki, JP;
Shigeaki Okutani, Kawasaki, JP;
Noboru Morita, Kawasaki, JP;
Keiji Sato, Kawasaki, JP;
Toshiro Nakazuru, Kawasaki, JP;
Shigeaki Okutani, Kawasaki, JP;
Noboru Morita, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
The present invention provides an access control device and a testing method that can simplify the software operations in an access control operation such as a JTAG control operation, and enable the hardware to perform a high-speed control operation. The access control device conducts a test or diagnosis on an object by accessing a serial interface based on a command and data that specify a testing or diagnosing route. Under the control of a processor, a control circuit in the access control device executes an access sequence in accordance with a command string and an input data string stored in a memory, and stores the data outputted from the object to be tested or diagnosed in the memory as an output data string. The control circuit sets a state transition route for each objective state in advance, so that a transition route can be readily determined for an objective state specified by the command string.