The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
Mar. 13, 2000
Kevin J. Barcomb, Burlington, VT (US);
Leendert M. Huisman, South Burlington, VT (US);
Mark F. Olive, Milton, VT (US);
Kevin C. Quandt, Milton, VT (US);
Kevin J. Barcomb, Burlington, VT (US);
Leendert M. Huisman, South Burlington, VT (US);
Mark F. Olive, Milton, VT (US);
Kevin C. Quandt, Milton, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for analyzing test data for objects on an IC or a wafer is provided. The test data is linked to available layout information about the object under test. Certain objects are selected based on the test data. A representation of the selected objects is placed on a map of the IC or on a map of the wafer. The representation should correspond to the physical location of the object on the IC or wafer. Preferably, the representation comprises one or more polygons that enclose all devices that make up the object.