The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
Feb. 26, 2004
Jin-yub Lee, Seoul, KR;
Dong-kyu Youn, Gyeonggi-do, KR;
Min-gun Park, Gyeonggi-do, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A NAND-type flash memory device including a memory cell array having a plurality of memory blocks is provided. An example NAND-type flash memory device includes a status cell array which has a plurality of status cells and stores data indicating erase/program statuses of the memory blocks, a data generation circuit which generates data indicating a program status of a selected memory block in response to a data input command and generates data indicating an erase status of a selected memory block in response to a block erase setup command, a first signal generation circuit which generates a block status write enable signal and a clock signal in response to either one of an erase command and a program command, a selection circuit which selects at least one of the status cells of the status cell array in response to a block address of the selected memory block, a write circuit which receives data from the data generation circuit in response to the clock signal during a program or erase operation and writes the received data in the selected status cell, and a control circuit which operates in response to a block status write enable signal from the first signal generation circuit and controls the write circuit so as to the store the data inputted to the write circuit in a selected status cell when an erase/program operation for the selected memory block is carried out.