The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2005

Filed:

Dec. 27, 2000
Applicants:

Shirun Ho, Tokyo, JP;

Miyuki Saji, Kokubunji, JP;

Sigeo Ihara, Tokorozawa, JP;

Satoshi Ito, Tokorozawa, JP;

Inventors:

Shirun Ho, Tokyo, JP;

Miyuki Saji, Kokubunji, JP;

Sigeo Ihara, Tokorozawa, JP;

Satoshi Ito, Tokorozawa, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F009/45 ;
U.S. Cl.
CPC ...
Abstract

Values of input parameters are set. Simulations are executed in parallel for individual sets of input parameters by a plurality of processors to obtain design values which are execution results. The obtained design values are compared with the design condition. Directory files are constructed for plural kinds of input parameters corresponding to design values satisfying the design condition. Accumulative distribution in the distribution of parameter input values are determined in respect of the individual kinds of input parameters. Input values of parameters to be referred are extracted on the basis of values of the accumulative distribution every kind of input parameter. The kind of input parameter, the extracted input values and the number of the extracted input values are displayed through an input interface every kind of input parameter.


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