The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2005
Filed:
Sep. 04, 2002
Applicants:
Sylvie Wuidart, Pourrieres, FR;
Luc Wuidart, Pourrieres, FR;
Michel Bardouillet, Rousset, FR;
Pierre Balthazar, Aix en Provence, FR;
Inventors:
Sylvie Wuidart, Pourrieres, FR;
Luc Wuidart, Pourrieres, FR;
Michel Bardouillet, Rousset, FR;
Pierre Balthazar, Aix en Provence, FR;
Assignee:
STMicroelectronics S.A., Montrouge, FR;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R027/28 ;
U.S. Cl.
CPC ...
Abstract
A method and a circuit for detecting variations of at least one environmental parameter of an integrated circuit, including evaluating a propagation delay of an edge in delay elements sensitive to variations of the environmental parameter, and comparing the present or measured delay with at least one reference value.