The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2005
Filed:
Jun. 19, 2003
David S. Kellerman, Lake Oswego, OR (US);
Steven R. Morris, Portland, OR (US);
Andrew H. Levy, Aloha, OR (US);
David S. Kellerman, Lake Oswego, OR (US);
Steven R. Morris, Portland, OR (US);
Andrew H. Levy, Aloha, OR (US);
Teseda Corporation, Portland, OR (US);
Abstract
A scan test viewing and analysis tool for an integrated circuit tester provides inter-related views of scan tests on an integrated circuit device. The tool processes a test program specification, execution results and device definition to produce cross-referencing data, which the tool then uses to provide navigation links between correlated locations in a cyclized test view, procedural test program view, and views of signal vectors, scan state and scan vectors. The tool also provides a capability to edit the test program in the views.