The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2005
Filed:
Apr. 11, 2003
Takashi Tatsumi, Tokyo, JP;
Takashi Tatsumi, Tokyo, JP;
Renesas Technology Corp., Chiyoda-ku, JP;
Abstract
A system-in-package (SiP) type semiconductor device has a test function capable of conducting a test singly on a memory chip directly from outside. When a mode signal included in a test signal input from an external connection terminal indicates a 'normal operation mode', a test circuit provided on a logic chip allows a logic circuit to use an access path (wiring) to a memory circuit. On the other hand, when the mode signal indicates a 'test mode', the test circuit uses the access path to access the memory circuit and conducts a test, an accelerated life test, or a multi-bit test, based on the content of the test signal input from the external connection terminal. The test circuit also conducts a built-in self-test.