The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2005
Filed:
Jun. 11, 2002
Ralf Hammer, Freiberg, DE;
Ralf Gruszynsky, Brand-Erbisdorf, DE;
André Kleinwechter, Freiberg, DE;
Tilo Flade, Freiberg, DE;
Ralf Hammer, Freiberg, DE;
Ralf Gruszynsky, Brand-Erbisdorf, DE;
André Kleinwechter, Freiberg, DE;
Tilo Flade, Freiberg, DE;
Freiberger Compound Materials GmbH, Freiberg, DE;
Abstract
An apparatus and a method for determining the orientation of a crystallographic plane (100) relative to a crystal surface () are provided, in which the orientation is free from errors of adhesion of the crystal or contamination of the holders for the crystal. For this purpose, the angle which the crystal surface to be measured forms with a reference axis and the angle which the crystallographic plane forms with the reference axis are measured and subtracted. In a wire sawing apparatus with an X-Y positioning unit, next the desired correction is made with the aid of measurement of the orientation and at the same time the crystal is displaced in horizontal and vertical positions. As a result, there remains a further degree of freedom of rotation of the crystal in the cutting plane for achieving a cut which is free from forces perpendicular to the feed direction and wire direction, so that no tool deflection takes place or the cutting forces are minimal. Further, the precision of orientation is increased.