The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2005

Filed:

Apr. 28, 2004
Applicants:

Edward W. Conrad, Jeffersonville, VT (US);

Craig E. Schneider, Underhill, VT (US);

John S. Smyth, Milton, VT (US);

Daniel B. Sullivan, Milton, VT (US);

Inventors:

Edward W. Conrad, Jeffersonville, VT (US);

Craig E. Schneider, Underhill, VT (US);

John S. Smyth, Milton, VT (US);

Daniel B. Sullivan, Milton, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F019/00 ;
U.S. Cl.
CPC ...
Abstract

A system and method for optimizing a manufacturing process. The system comprises: a database of operational data gathered from previously performed manufacturing processes; a filtering system for filtering the database into a plurality of data subsets; a calculation system for calculating evaluation criteria for a selected data subset; an analysis system for determining if the evaluation criteria meets a set of predetermined requirements; and an iteration system that selects a new data subset if the selected data subset fails to provide evaluation criteria that meets the set of predetermined requirements.


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