The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2005
Filed:
Jul. 26, 2001
Naoki Inamoto, Kumamoto, JP;
Yoshimi Sawamura, Kyoto, JP;
Shinji Fujimura, Shiga, JP;
Kunikazu Taguchi, Hirakata, JP;
Naoki Inamoto, Kumamoto, JP;
Yoshimi Sawamura, Kyoto, JP;
Shinji Fujimura, Shiga, JP;
Kunikazu Taguchi, Hirakata, JP;
Otsuka Electronics Co., Ltd., Osaka, JP;
Abstract
In an automatic optical measurement method according to the invention, with a movable reflection platemoved to place under an optical axis, light projected from a light projecting portionis received by a light receiving portionvia the movable reflection platea stationary reflection plateand the movable reflection platewhereas with the movable reflection platemoved away from the optical axis and a referenceset on a sample stagelight projected from the light projecting portionis received by the light receiving portionvia the referencewhereby a ratio between the intensities of the received lights is determined. During a sample measurement, light projected from the light projecting portionwith the movable reflection platemoved to place under the optical axis is received by the light receiving portionvia the movable reflection plate, stationary reflection plateand movable reflection plateso that the intensity of light thus received and the above ratio are used for estimating an intensity of light to be measured with the reference, the estimated intensity of light being used for correcting an intensity of light received via a sample.