The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2005

Filed:

May. 04, 2004
Applicants:

Hisayuki Taktsu, Oarai, JP;

Toru Iwaya, Hitachiota, JP;

Koichi Miyazawa, Mito, JP;

Sakae Koubori, Katsura, JP;

Inventors:

Hisayuki Taktsu, Oarai, JP;

Toru Iwaya, Hitachiota, JP;

Koichi Miyazawa, Mito, JP;

Sakae Koubori, Katsura, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F26B003/00 ;
U.S. Cl.
CPC ...
Abstract

The object of the present invention is to provide a microstructure drying treatment method by which a substrate having a microstructure has a fine pattern of less than 30 nm and a large-caliber substrate of 100 mm or more can be dried uniformly and in a short time without generating pattern collapse, and its apparatus and its high pressure vessel. The present invention is a microstructure drying treatment method of introducing a fluid that is gas at normal temperature and pressure and is liquid under high pressure inside a high pressure vessel in which a substrate having a microstructure in a state immersed in or wet with a rinsing liquid in a liquid or supercritical state. The method forms a specific gravity difference between the rinsing liquid and fluid inside the high pressure vessel and collects the rinsing liquid to the upper side or lower side of the high pressure vessel by changing at least one side of the temperature and pressure of the fluid and changing the specific gravity of the fluid.


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