The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2005
Filed:
Jan. 25, 2001
Applicant:
Mark J. Kraffert, Meridian, ID (US);
Inventor:
Mark J. Kraffert, Meridian, ID (US);
Assignee:
Micron Technology, Inc., Nampa, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F009/44 ;
U.S. Cl.
CPC ...
Abstract
A test environment comprises a terminal coupled to a database system over a communications link. A software application under test is executable in the database system. In one example, a Telnet session is established between the terminal and the database system, with a bitmap representing an output of the software application communicated to the terminal. To perform a test procedure, the terminal extracts a value from a predefined region of the bitmap.