The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2005
Filed:
Jun. 28, 2002
Kee Sup Kim, Folsom, CA (US);
Shyang-tai Sean Su, Folsom, CA (US);
Adarsh Kalliat, Kerala, IN;
Ajith Prasad, Bangalore, IN;
Kee Sup Kim, Folsom, CA (US);
Shyang-Tai Sean Su, Folsom, CA (US);
Adarsh Kalliat, Kerala, IN;
Ajith Prasad, Bangalore, IN;
Intel Corporation, Santa Clara, CA (US);
Abstract
A testing device uses an input signature register to conduct 'at speed' testing of asynchronous circuit responses in an effort to determine the operability of a monitored circuit. Upon receiving an enable signal, the input signature register quickly measures, compresses, and transmits the tested circuit responses so that the responses can be compared with a set of anticipated responses to determine whether the circuit is functioning properly. The enabled input signature register, such as a MISR or a SISR, generates an output signature, which contains the compressed responses of the monitored circuit and helps the testing device analyze circuit performance.