The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 12, 2005
Filed:
Jul. 10, 2003
Hirotaka Oosawa, Isesaki, JP;
Masumi Kasahara, Takasaki, JP;
Kazuo Watanabe, Takasaki, JP;
Renesas Technology Corporation, Tokyo, JP;
Abstract
An input/output pin for test corresponding to a test circuit of the digital section is used in common as the input/output pin for normal operation of the analog section. The selection switches are respectively provided between the relevant analog pin and analog circuit and on a signal line up to the test circuit of the digital section from the relevant analog pin and the switches are provided at both end portions of the signal line between the test circuit of digital section and the input/output pin for common use in order to fix the voltage of the signal line to the predetermined voltage such as the ground voltage during the normal operation. Thereby, it is possible in a semiconductor integrated circuit having the analog and digital sections to eliminate adverse effect, even if the input/output pin for testing corresponding to the test circuit of the digital section is used in common as the input/output pin for normal operation of the analog section, from the analog circuit due to the noise which is generated in the digital section and is then transferred to the analog circuit through the signal path up to the analog input/output pin connected to the test circuit from this test circuit of the digital section.