The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 28, 2005

Filed:

Apr. 02, 2003
Applicants:

Razak Hossain, San Diego, CA (US);

Marco Cavalli, Gambara, IT;

Inventors:

Razak Hossain, San Diego, CA (US);

Marco Cavalli, Gambara, IT;

Assignee:

STMicroelectronics, Inc., Carrollton, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K019/096 ;
U.S. Cl.
CPC ...
Abstract

A testable, pulse-triggered static flip-flop. A pulse generator produces a data enable trigger pulse only when a test enable input is low, and a scan test enable trigger pulse only when a test enable input is high. The data enable trigger pulse controls the data input to the flip-flop, while the scan test enable trigger pulse controls the scan test input to the flip-flop. The flip-flop consists of a selection circuit comprised of two latches, each including an inverter and a transmission gate. One latch receives the data input and the other latch receives the scan test input. The data enable trigger pulse controls the transmission gate receiving the data input, and the scan test trigger pulse controls the transmission gate receiving the scan test input. The flip-flop also includes a keeper circuit consisting of a feedback inverter and a static latch.


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