The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2005

Filed:

May. 30, 2003
Applicants:

Gopal Vasudevan, San Jose, CA (US);

Eric Hartel Smith, San Jose, CA (US);

Robert Duncan Reardon, Mountain View, CA (US);

Inventors:

Gopal Vasudevan, San Jose, CA (US);

Eric Hartel Smith, San Jose, CA (US);

Robert Duncan Reardon, Mountain View, CA (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B009/02 ;
U.S. Cl.
CPC ...
Abstract

A method is provided for reducing the piston of neighboring first and second surfaces illuminated by polychromatic light transmitted from an unresolved-light source such that light transmitted or reflected from the first surface is out of phase with light respectively transmitted or reflected from the second surface, and the out-of-phase light is passed through a grism that generates a fringe pattern in the far-field. According to one exemplary embodiment, the method includes Fourier transforming the fringe pattern to generate a two-dimensional (2D) power spectrum; generating the absolute value of the 2D power spectrum to form an absolute value representation; displaying the 2D the absolute value representation on a computer display; and reducing the piston to affect rotation of the absolute value representation on the computer display and approximately align a central axis of the absolute value representation with an axis that indicates approximate alignment of the first and second surfaces.


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