The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2005

Filed:

Apr. 07, 2003
Applicants:

Martin J. Gabriel, Iii, Austin, TX (US);

VU N. DO, Austin, TX (US);

Justin E. Dougherty, Austin, TX (US);

David H. Griffin, Dripping Springs, TX (US);

Inventors:

Martin J. Gabriel, III, Austin, TX (US);

Vu N. Do, Austin, TX (US);

Justin E. Dougherty, Austin, TX (US);

David H. Griffin, Dripping Springs, TX (US);

Assignee:

Silicon Laboratories, Inc., Austin, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R031/02 ;
U.S. Cl.
CPC ...
Abstract

A test socket () includes first () and second () test leads and a first electrically conductive member (). The first test lead is adapted to contact a first external inductor terminal of an integrated circuit (). The second test lead () is adapted to contact a second external inductor terminal of the integrated circuit (). The first electrically conductive member () extends between the first test lead () and the second test lead (), thereby forming an inductance loop between the first external inductor terminal and the second external inductor terminal.


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