The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 21, 2005

Filed:

Aug. 06, 2003
Applicants:

Bruno Ghyselen, Seyssinet-Pariset, FR;

Cécile Aulnette, Grenoble, FR;

Bénédite Osternaud, Saint Egreve, FR;

Inventors:

Bruno Ghyselen, Seyssinet-Pariset, FR;

Cécile Aulnette, Grenoble, FR;

Bénédite Osternaud, Saint Egreve, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L031/26 ; H01L021/66 ;
U.S. Cl.
CPC ...
Abstract

A method for adjusting the thickness of a thin semiconductor material layer. The method includes measuring the layer to establish a thickness profile, determining thickness adjustment specifications from the measured thickness profile, and adjusting the thickness of the layer in accordance with the specifications by sacrificial oxidation. An apparatus for adjusting the thickness of a thin layer of semiconductor material according to this method is also disclosed.


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