The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 14, 2005
Filed:
May. 02, 2001
Applicant:
Anjam Khursheed, Singapore, SG;
Inventor:
Anjam Khursheed, Singapore, SG;
Assignee:
National University of Singapore, Singapore, SG;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J037/18 ;
U.S. Cl.
CPC ...
Abstract
A lens () for a scanning electron microscope is adapted to be removably mounted on a specimen stage (). The lens () includes a magnetic circuit () having a first magnetic pole piece () and a second magnetic pole piece (), and a specimen holder (). The specimen holder () is located between the first and second magnetic pole pieces (). The magnetic circuit () also includes a lens bore () to permit an electron beam () to strike a surface of a specimen mounted on the specimen holder (), in use. The lens bore () has a width of greater than 1 mm.