The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2005
Filed:
Apr. 01, 2003
Alexei V. Nikitin, Lawrence, KS (US);
Mark G. Frei, Lawrence, KS (US);
Naresh C. Bhavaraju, Lawrence, KS (US);
Ivan Osorio, Leawood, KS (US);
Ruslan Davidchack, Wigston, GB;
Alexei V. Nikitin, Lawrence, KS (US);
Mark G. Frei, Lawrence, KS (US);
Naresh C. Bhavaraju, Lawrence, KS (US);
Ivan Osorio, Leawood, KS (US);
Ruslan Davidchack, Wigston, GB;
Flint Hills Scientific, L.L.C., Lawrence, KS (US);
Abstract
A method, computer program, and system for real-time signal analysis providing characterization of temporally-evolving densities and distributions of signal features of arbitrary-type signals in a moving time window by tracking output of order statistic filters (also known as percentile, quantile, or rank-order filters). Given a raw input signal of arbitrary type, origin, or scale, the present invention enables automated quantification and detection of changes in the distribution of any set of quantifiable features of that signal as they occur in time. Furthermore, the present invention's ability to rapidly and accurately detect changes in certain features of an input signal can also enable prediction in cases where the detected changes associated with an increased likelihood of future signal changes.