The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2005
Filed:
Jul. 02, 2003
Tomoya Kawagoe, Hyogo, JP;
Takeshi Hamamoto, Hyogo, JP;
Tomoya Kawagoe, Hyogo, JP;
Takeshi Hamamoto, Hyogo, JP;
Renesas Technology Corp., Tokyo, JP;
Abstract
At the time of burn-in test, substrate voltages of transistors in a sense amplifier are switched by a PMOS substrate voltage generating portion and an NMOS substrate voltage generating portion. Specifically, the substrate voltage of a P channel MOS transistor is increased during the test than in a normal operation, whereas the substrate voltage of an N channel MOS transistor is decreased during the test than in the normal operation. Consequently, the threshold voltages of the P channel and N channel MOS transistors can be increased upon the test. Leakage currents in the turned-off states can be reduced, and thus, power consumption during the burn-in test can be decreased.