The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2005
Filed:
Aug. 09, 2001
Thomas W. Bartenstein, Owego, NY (US);
L. Owen Farnsworth, Iii, Lincoln, VT (US);
Douglas C. Heaberlin, Underhill, VT (US);
Edward E. Horton, Iii, Westford, VT (US);
Leendert M. Huisman, South Burlington, VT (US);
Leah M. Pastel, Essex, VT (US);
Glen E. Richard, Essex Junction, VT (US);
Raymond J. Rosner, Colchester, VT (US);
Francis Woytowich, Charlotte, VT (US);
Thomas W. Bartenstein, Owego, NY (US);
L. Owen Farnsworth, III, Lincoln, VT (US);
Douglas C. Heaberlin, Underhill, VT (US);
Edward E. Horton, III, Westford, VT (US);
Leendert M. Huisman, South Burlington, VT (US);
Leah M. Pastel, Essex, VT (US);
Glen E. Richard, Essex Junction, VT (US);
Raymond J. Rosner, Colchester, VT (US);
Francis Woytowich, Charlotte, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of testing a semiconductor device having a memory is disclosed. The method includes selecting a portion of the memory; testing the selected portion of the memory; designating the selected portion of the memory as a designated memory in response to an acceptable testing result; and storing data in the designated portion of the memory for retrieval at a later time. Provision for soft repair of the selected memory is made. Test data can be compressed before being stored in the designated memory.