The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2005
Filed:
Jun. 19, 2001
Sunil K. Jain, Folsom, CA (US);
Gregory P. Chema, El Dorado Hills, CA (US);
Sunil K. Jain, Folsom, CA (US);
Gregory P. Chema, El Dorado Hills, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Testing of a mixed signal electronic device, and evaluating of a test environment. A test driver applies an input test signal to the device. The response of the device is monitored on a differential monitoring device to obtain analog data and on a tester receiver to obtain digital data. The analog data and the digital data are processed, the processed data are compared and evaluated, and the device is evaluted. A virtual test environment is created emulating an actual test environment, and a virtual device emulating the actual device is created and is stimulated with an input test signal emulating an actual input signal. The response of the virtual device is monitored to obtain analog data and digital data. The analog data and the digital data are processed, the processed analog and digital data are compared and evaluated, and the virtual device is evaluated.