The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 17, 2005
Filed:
Feb. 19, 2002
Applicants:
Spencer M. Gold, Pepperell, MA (US);
Claude R. Gauthier, Fremont, CA (US);
Brian W. Amick, Austin, TX (US);
Kamran Zarrineh, Nashua, NH (US);
Steven R. Boyle, Santa Clara, CA (US);
Inventors:
Spencer M. Gold, Pepperell, MA (US);
Claude R. Gauthier, Fremont, CA (US);
Brian W. Amick, Austin, TX (US);
Kamran Zarrineh, Nashua, NH (US);
Steven R. Boyle, Santa Clara, CA (US);
Assignee:
Sun Microsystems, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K011/00 ; G01K007/32 ; G01K001/02 ;
U.S. Cl.
CPC ...
Abstract
An apparatus and method are provided for sensing a physical stimulus of an integrated circuit. The apparatus and method allow for accurate die temperature measurements of the integrated circuit and are able to provide a highly accurate die temperature measurement without the need for an independent voltage source or current source.