The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6891226 B1

PDF
Full Text
Expired
Date of Patent:
May. 10, 2005

Filed:

May. 30, 2003
Applicants:

Toshiharu Furukawa, Essex Junction, VT (US);

Mark C. Hakey, Fairfax, VT (US);

Steven J. Holmes, Milton, VT (US);

David V. Horak, Essex Junction, VT (US);

William H. MA, Fishkill, NY (US);

Inventors:

Toshiharu Furukawa, Essex Junction, VT (US);

Mark C. Hakey, Fairfax, VT (US);

Steven J. Holmes, Milton, VT (US);

David V. Horak, Essex Junction, VT (US);

William H. Ma, Fishkill, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L029/76 ; H01L029/94 ; H01L031/062 ;
U.S. Cl.
CPC ...
Abstract

The present invention features double- or dual-gate logic devices that contain gate conductors that are consistently self-aligned and that have channels that are of constant width. A single-crystal silicon wafer is utilized as the channel material. Pillars or stacks of self aligned dual gate MOSFETs are generated by etching, via the juxtaposition of overlapping germanium-containing gate conductor regions. Vertically etching through regions of both gate conducting material and dielectric insulating material provides an essentially perfect, self-aligned dual gate stack.


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Furukawa, Toshiharu. (2005). Dual gate logic device (U.S. Patent No. 6891226). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6891226

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